Lena Eberle, Anna: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Alternative Lithographic Technologies VII - Massively parallel E-beam inspection: enabling next-generation patterned defect inspection for wafer and mask manufacturing

Resnick, Douglas J., Bencher, Christopher, Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomas

Year:

2015

Language:

english

File:

PDF, 694 KB

english, 2015

2

SPIE Proceedings [SPIE 31st European Mask and Lithography Conference - Eindhoven, Netherlands (Monday 22 June 2015)] 31st European Mask and Lithography Conference - Enabling inspection solutions for future mask technologies through the development of massively parallel E-Beam inspection

Behringer, Uwe F.W., Finders, Jo, Malloy, Matt, Thiel, Brad, Bunday, Benjamin D., Wurm, Stefan, Jindal, Vibhu, Mukhtar, Maseeh, Quoi, Kathy, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski,

Year:

2015

Language:

english

File:

PDF, 997 KB

english, 2015

3

Multi-beam SEM Technology for High Throughput Imaging

Crosby, Kyle, Eberle, Anna Lena, Zeidler, Dirk

Journal:

Year:

2016

Language:

english

File:

PDF, 920 KB

english, 2016

4

[IEEE 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2015.5.3-2015.5.6)] 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Enabling future generation high-speed inspection through a massively parallel e-beam approach

Malloy, Matt, Bunday, Benjamin, Wurm, Stefan, Thiel, Brad, Kemen, Thomas, Zeidler, Dirk, Eberle, Anna Lena, Garbowski, Tomasz, Dellemann, Gregor, Peters, Jan Hendrik

Year:

2015

Language:

english

File:

PDF, 990 KB

english, 2015

5

Multiple-Beam Scanning Electron Microscopy

Lena Eberle, Anna, Schalek, Richard, Lichtman, Jeff W., Malloy, Matt, Thiel, Brad, Zeidler, Dirk

Journal:

Microscopy Today

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

6

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Advances in X-Ray/EUV Optics and Components VIII - Two-dimensional sub-5-nm hard x-ray focusing with MZP

Osterhoff, Markus, Bartels, Matthias, Döring, Florian, Eberl, Christian, Hoinkes, Thomas, Hoffmann, Sarah, Liese, Tobias, Radisch, Volker, Rauschenbeutel, Arno, Robisch, Anna-Lena, Ruhlandt, Aike, Sch

Year:

2013

Language:

english

File:

PDF, 3.06 MB

english, 2013

7

High Throughput Shale Rock Imaging Using Multi-Beam Scanning Electron Microscopy

Lena Eberle, Anna, Garbowski, Tomasz, Bhattiprolu, Sreenivas, Crosby, Kyle, Zeidler, Dirk

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 212 KB

english, 2017

8

Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research

Eberle, Anna Lena, Zeidler, Dirk

Journal:

Frontiers in Neuroanatomy

Year:

2018

Language:

english

File:

PDF, 1.09 MB

english, 2018

9

Multi-beam Electron Microscopy: Principles and Applications

Eberle, Anna Lena, Zeidler, Dirk

Journal:

Microscopy and Microanalysis

Year:

2016

Language:

english

File:

PDF, 137 KB

english, 2016

10

Multi-beam Electron Microscopy: Principles and Applications

Eberle, Anna Lena, Zeidler, Dirk

Journal:

Microscopy and Microanalysis

Year:

2016

File:

PDF, 137 KB

2016

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски